Abstract
The characterization of products and processes by space- or time-related sets of measurements (profiles) is becoming an increasingly common situation in today’s highly instrumentalized manufacturing systems. Even though many applications and methodologies in which profile measurements are employed as inputs to analysis tasks have already been proposed and described, problems in which they naturally appear as outputs are rare. Therefore, in this work, we present real-world applications in which profiles are the desired prediction targets and describe the methodologies followed to address the underlying analysis goals. In this context, we show how to properly establish the sample-specific prediction intervals for profiles, in a simple and flexible way, through nonparametric resampling or noise addition procedures. The added value of the various analyses carried out during the description of the case studies is also highlighted from the standpoint of the associated benefits for process improvement.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
