Abstract
A statistical modeling technique known as the random coupling model (RCM) is an effective method for estimating the probabilistic magnitudes of induced voltages on objects within a closed, complex, three-dimensional (3-D) enclosure. The limitations of the RCM to predict electromagnetic wave coupling into an enclosure with apertures are examined. We experimentally demonstrate the applicability of the RCM to estimate the probabilistic magnitudes of voltages induced on ports in a complex 3-D enclosure with an electrically large aperture. This study is a first step toward being able to predict effects on sensitive electronic targets in large, real-world, lossy enclosures such as office buildings, ship compartments, and aircraft compartments.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: IEEE Transactions on Electromagnetic Compatibility
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
