Prediction of Electronic Unit Radiated Emissions from Both PCB Near Field and Shielding Enclosure Characterization

Abstract

This paper presents the post-processing methodology devoted to the Near-Field-Scanning (NFS) to provide assistance in ElectroMagnetic Compatibility (EMC) design phases of complex electronics products. A major challenge for spacecraft manufacturers for incoming year concerns the control of units Radiated Emissions (RE). Indeed, high speed links could induce RE non-compliance for units in on-board receiver frequencies (ex: GPS, TCR…). To avoid additional test campaign or system level analyses, Near Field techniques could be a powerful way to anticipate RE non-conformities in unit design phase. Based both on NFS (only $H_{x}$ and $H_{y}$ magnetic components very closed to the Printed Circuit Board (PCB)), and on Shielding enclosure Effectiveness (SE) characterization, the proposed “NFS 2 RE” (Near Field Scanning to Radiated Emission Test) methodology allows: 1)RE-Test prediction of PCB in free space condition from only $H_{x}$ and $H_{y}$ NFS 2)Prediction of Shielding PCB's enclosure attenuation on RE-Test from SE characterization