Abstract
Periodic reflective rectangular diffuser profiles have been previously studied by Embrechts through an analytical method calculating their random incidence scattering coefficients. This paper presents the results of further investigations obtained by real-scale and 1:5th scale random incidence scattering coefficient measurements on these profiles. All measurements were performed according to the corresponding ISO 354 and ISO 17497-1 standards. The measurement results are compared with the calculation results derived by the analytical method. Although some periodic profiles could not be treated by the analytical model, fairly good agreements are obtained between the different approaches. The real scale and 1:5th scale measurement results are also presented and compared.
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