Abstract
We demonstrate that the optoelectronic properties of percolating thin films of silver nanowires (AgNWs) are predominantly dependent upon the length distribution of the constituent AgNWs. A generalized expression is derived to describe the dependence of both sheet resistance and optical transmission on this distribution. We experimentally validate the relationship using ultrasonication to controllably vary the length distribution. These results have major implications where nanowire-based films are a desirable material for transparent conductor applications; in particular when application-specific performance criteria must be met. It is of particular interest to have a simple method to generalize the properties of bulk films from an understanding of the base material, as this will speed up the optimisation process. It is anticipated that these results may aid in the adoption of nanowire films in industry, for applications such as touch sensors or photovoltaic electrode structures.
Highlights
We demonstrate that the optoelectronic properties of percolating thin films of silver nanowires (AgNWs) are predominantly dependent upon the length distribution of the constituent AgNWs
Alternative materials investigated as Indium Tin Oxide (ITO) replacements have included graphene, carbon nanotubes, metal mesh and random metal nanowire films
It has long been understood that the performance of nanowire films as transparent conductors is linked to the length of the nanowires used[3,4,5,6,7]
Summary
We demonstrate that the optoelectronic properties of percolating thin films of silver nanowires (AgNWs) are predominantly dependent upon the length distribution of the constituent AgNWs. We experimentally validate the relationship using ultrasonication to controllably vary the length distribution These results have major implications where nanowire-based films are a desirable material for transparent conductor applications; in particular when applicationspecific performance criteria must be met. It is anticipated that these results may aid in the adoption of nanowire films in industry, for applications such as touch sensors or photovoltaic electrode structures. The rapid adoption of nanowire films in transparent conductor applications requires a robust method for designing materials capable of meeting application-specific performance requirements. These requirements typically include high transmittance and low sheet resistance. Two established forms for this relation exist at present; the first describes continuous bulk films[1], and the second describes percolating nanostructured materials[2]; T
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