Abstract

The first X-ray free electron laser (XFEL) at keV energies will be the Linac Coherent Light Source (LCLS), located at the SLAC National Accelerator Laboratory. Scheduled to begin operation in 2009, this first-of-a-kind X-ray source will produce ultra-short X-ray pulses of unprecedented brightness in the 0.8 to 8 keV first harmonic photon energy regime. Much effort has been invested in predicting and modeling the XFEL photon source properties at the undulator exit; however, as most LCLS experiments are ultimately dependent on the beam focal spot properties it is equally as important to understand the XFEL beam at the endstations where the experiments are performed. Here, we use newly available precision surface metrology data from actual LCLS mirrors combined with a scalar diffraction model to predict the LCLS beam properties in the experiment chambers.

Highlights

  • The first X-ray free electron laser (XFEL) will be the Linac Coherent Light Source (LCLS), located at the SLAC National Accelerator Laboratory (SLAC) in California

  • The revolutionary capabilities of this new X-ray source are anticipated to generate a wealth of ground-breaking new science, with experiments planned in the fields of atomic, molecular and optical science (AMO); soft X-ray scattering (SXR), x-ray pump-probe (XPP); x-ray photon correlation spectroscopy (XPCS); coherent x-ray imaging (CXI); and materials under extreme conditions (MEC) [1]

  • The focal spot structure at the LCLS X-ray free electron laser is of key importance to many planned experiments

Read more

Summary

Introduction

The first X-ray free electron laser (XFEL) will be the Linac Coherent Light Source (LCLS), located at the SLAC National Accelerator Laboratory (SLAC) in California. The revolutionary capabilities of this new X-ray source are anticipated to generate a wealth of ground-breaking new science, with experiments planned in the fields of atomic, molecular and optical science (AMO); soft X-ray scattering (SXR), x-ray pump-probe (XPP); x-ray photon correlation spectroscopy (XPCS); coherent x-ray imaging (CXI); and materials under extreme conditions (MEC) [1]. The first generation of x-ray offset mirrors were specified, designed, engineered and fabricated by a team of scientists, engineers and technicians from National Laboratories and industry led by Lawrence Livermore National Laboratory (LLNL) [5,6,7] As part of this development cycle extensive metrology has been performed on these mirrors to characterize and quantify their optical errors and verify that they meet specifications [6]. We use these metrology data to predict the focal spot properties in the experiment chambers when LCLS turns on in 2009

The LCLS optical system
Diagnostics and wavefront measurement
Findings
Conclusions
Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call