Abstract

Abstract : Atomic force microscopy is extremely useful in the study of surface defects in crystals by providing topographical data at the nanometric scale. With the aide of advanced statistical analysis, nanoscale surface data acquired through atomic force microscopy can also be utilized to predict behavior at the macroscale. The behavioral model presented is the measure of shock sensitivity required to produce detonation of explosive crystal test samples. The surfaces studied were of 7 different varieties of (RDX) crystalline explosives from 5 manufacturers (Doherty & Watts, 2008). It has been speculated that particle size,crystal defects, density and crystal morphology may play a role in the shock sensitivity of RDX and there have been numerous attempts to quantify and/or link particular features of the explosive particles to the shock sensitivity behavior of their larger compositions (Doherty and Watts, 2008). The shock sensitivity data were obtained from model test compositions prepared as polymer-bonded explosives using hydroxy-terminated polybutadiene (HTPB) as the binder. The shock sensitivity, measured in a gap test, is the shock required to produce a detonation of the test composition 50% of the time. Varied card thicknesses of poly(methyl-methacrylate) (PMMA) are used to attenuate the initiating charge entering the sample tube. The shock pressure (GPa) impacting the sample is determined by the number of cards. A small number of cards translate to a larger shock and thus a less shock sensitive sample.

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