Precision Measurement Technology at the 56th International Scientific Colloquium in Ilmenau

Abstract

The 56th International Scientific Colloquium was held from 12th to 16th September 2011 at the Ilmenau University of Technology in Germany. This event was organized by the Faculty of Mechanical Engineering under the title: 'Innovation in Mechanical Engineering—Shaping the Future' and was intended to reflect the entire scope of modern mechanical engineering. In three main topics many research areas, all involving innovative mechanical engineering, were addressed, especially in the fields of Precision Engineering and Precision Measurement Technology, Mechatronics and Ambient-Assisted Living and Systems Technology. The participants were scientists from 21 countries, and 166 presentations were given.This special issue of Measurement Science and Technology presents selected contributions on 'Precision Engineering and Precision Measurement Technology'. Over three days the conference participants discussed novel scientific results in two sessions. The main topics of these sessions were:Measurement and Sensor Technology Process measurement Laser measurement Force measurement Weighing technology Temperature measurement Measurement dynamicsand Nanopositioning and Nanomeasuring Technology Nanopositioning and nanomeasuring machines Nanometrology Probes and tools Mechanical design Signal processing Control and visualization in NPM devicesSignificant research results from the Collaborative Research Centre SFB 622 'Nanopositioning and Nanomeasuring Machines' funded by the German Research Foundation (DFG) were presented as part of this topic.As the Chairmen, our special thanks are due to the International Programme Committee, the Organization Committee and the conference speakers as well as colleagues from the Institute of Process Measurement and Sensor Technology who helped make the conference a success. We would like to thank all the authors for their contributions, the referees for their time spent reviewing the contributions and their valuable comments, and the whole Editorial Board of Measurement Science and Technology for their support.