Abstract
The precision with which the ith parameter of a resonance spectrum profile can be measured by least-squares estimation is shown to be c iK 1 2 R , where c i depends on the line shape, K is the number of observed points per profile linewidth, and R is the profile signal-to-noise ratio (SNR). The maximum useful value of K is twice the product of spectrometer output bandwidth and the time taken to sweep through a linewidth. The product c i R is invariant under linear operations; consequently data processing such as numerical filtering, SNR enhancement, smoothing, etc., does not improve the potentially attainable measurement precision.
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