Abstract
Abstmct-The measurement and the use of phase in acoustic microscopy are discussed. It is demonstrated that in many applications phase can be used to provide sensitivity and information unparalleled by amplitude-only measurement methods. A technique capable of highaccuracy measurement of the phase of short RF acoustic pulses is described. The power of this phase measurement technique is illustrated in a number of applications. Surface material property measurements such as the Rayleigh-wave velocity and the inversion of the complex V(z) to obtain the reflectance function of a liquid-solid interface are considered. Surface topography mapping based on phase measurement is examined. A Fourier transform approach for precision determination of linewidths comparable to the resolution spot size is also presented.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
