Abstract
AbstractThis paper presents a precise measurement method for obtaining the drive power dependency of frequency in highly stabilized quartz‐crystal oscillators. The method is aimed at improving the frequency stability of crystal oscillators and, in particular, oven‐controlled crystal oscillators (OCXOs). It uses a transistor Colpitts oscillation circuit which features excellent resolution and reproducibility of electrical current measurements as well as higher operating frequencies than those of conventional techniques such as transmission or reflection methods. In this paper, the authors demonstrated concepts of this method and a corresponding measurement system. The proposed method also was applied to SC‐cut crystal oscillators used in OCXOs which had shown nonsatisfactory frequency stability (discussed earlier by the authors). Here, the authors demonstrated that those problems were caused by frequency jumps in the oscillator frequency‐versus‐current characteristic. It was shown also that OCXO circuits with excellent reproducibility of temperature characteristics can be implemented by using an appropriate level of driving current to drive the quartz oscillator in the generation mode.
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