Abstract
Focused vortex beams are characterized in terms of their intensity and phase using an iterative phase retrieval method. The vortex beams generated by a vortex phase plate contain several phase singularities and vortex phase distributions. The wavefields were retrieved using many far-field diffraction profiles obtained by scanning a pinhole along the focal plane. The retrieved intensity and phase distributions agreed well with those predicted using the actual profiles of vortex phase plates, which indicates that the phase retrieval method can be used for the precise characterization of vortex beams. The information obtained is valuable for improving the performance of methods involving vortex beams, such as microscopy and laser processing.
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