Abstract

The basics of precession electron diffraction (PED) in a transmission electron microscope (TEM) are briefly discussed. An automated system for the mapping of nanocrystal phases and orientations in a TEM is briefly described. This system is primarily based on the projected reciprocal lattice geometry as extracted from experimental precession electron diffraction spot patterns. Comprehensive open-access crystallographic databases may be used in support of the automated crystallite phase identification process and are, therefore, also briefly mentioned.

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