Abstract
The basics of precession electron diffraction (PED) in a transmission electron microscope (TEM) are briefly discussed. An automated system for the mapping of nanocrystal phases and orientations in a TEM is briefly described. This system is primarily based on the projected reciprocal lattice geometry as extracted from experimental precession electron diffraction spot patterns. Comprehensive open-access crystallographic databases may be used in support of the automated crystallite phase identification process and are, therefore, also briefly mentioned.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
