Abstract

In this study, Pre-diagnosis of degraded aluminum indium gallium phosphide (AlInGaP) light-emitting diodes (LEDs) that were soaked in liquid nitrogen (LN <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sub> ) was performed. To visualize the early deterioration of LED emission, a combination of material, electrical, optical, and computer-aided machine-vision analysis of LED failure spots on the surface was examined. Results indicate that several small failure spots, which can be identified by the MATLAB processed emission images and surface roughness variation, can be found. Furthermore, LN <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sub> soaking induced some local damages inside the device that penetrate the multiple-quantum well. The decrease of current and luminescence intensity also reflects the gradual degradation of the device after being soaked in LN <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sub> . This integrated analysis and Pre-diagnosis of the degraded device provided early screening of LED failure spots and real-time inspection during operations.

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