Pre-Detection Sensing With Multistage Low-Pass Type Negative Group Delay Circuit

Abstract

This paper reveals a fascinating pre-detection technique of sensor signals by means of counterintuitive negative group delay (NGD) electronic function. The sensor signal pre-detection technique is unconventionally developed thanks to the engineering of low-pass (LP) type NGD circuit. The NGD pre-detection basic principle is introduced. After topological description, the LP-NGD cell design method in function of negative time delay specification is formulated. An innovative analysis of time-advance property related to multi-stage LP-NGD cell is elaborated. To demonstrate the LP-NGD pre-detection technique feasibility, a proof of concept (POC) is designed with fabricated 3-stage LP-NGD printed circuit board (PCB) prototype integrating 4 LED detectors. The NGD pre-detection experimental setup is described. Extraordinary pre-detection with −0.5 s negative time propagation visible with LED on-lightning is demonstrated by considering a sinc pulse input signal. The developed NGD pre-detection technique can be useful in the future for the anticipation of industrial equipment damages and failure pre-detection sensor system in real-time.