Abstract
Photoelectron spectra have been recorded by use of synchrotron radiation, before and after exposure to oxygen of the Pr/Al and Pr/Ta overlayer systems. Pr is found to react with Al at room temperature to form a thin interface alloy. Pr forms an overlayer when deposited on a Ta substrate. In both cases an enhancement in the initial rate of substrate oxide growth is observed in the presence of Pr. The present work is consistent with previous results obtained on other rare-earth overlayer systems.
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