Abstract
Journal Article Practical Use of Scanning Low Energy Electron Microscope (SLEEM) Get access Ilona Müllerová, Ilona Müllerová Department of Electron Microscopy, Institute of Scientific Instruments ASCR, v.v.i., Brno, Czech Republic Search for other works by this author on: Oxford Academic Google Scholar Eliška Mikmeková, Eliška Mikmeková Department of Electron Microscopy, Institute of Scientific Instruments ASCR, v.v.i., Brno, Czech Republic Search for other works by this author on: Oxford Academic Google Scholar Šárka Mikmeková, Šárka Mikmeková Department of Electron Microscopy, Institute of Scientific Instruments ASCR, v.v.i., Brno, Czech Republic Search for other works by this author on: Oxford Academic Google Scholar Ivo Konvalina, Ivo Konvalina Department of Electron Microscopy, Institute of Scientific Instruments ASCR, v.v.i., Brno, Czech Republic Search for other works by this author on: Oxford Academic Google Scholar Luděk Frank Luděk Frank Department of Electron Microscopy, Institute of Scientific Instruments ASCR, v.v.i., Brno, Czech Republic Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 22, Issue S3, 1 July 2016, Pages 1650–1651, https://doi.org/10.1017/S1431927616009090 Published: 25 July 2016
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.