Abstract
Journal Article Practical Use of Scanning Low Energy Electron Microscope (SLEEM) Get access Ilona Müllerová, Ilona Müllerová Department of Electron Microscopy, Institute of Scientific Instruments ASCR, v.v.i., Brno, Czech Republic Search for other works by this author on: Oxford Academic Google Scholar Eliška Mikmeková, Eliška Mikmeková Department of Electron Microscopy, Institute of Scientific Instruments ASCR, v.v.i., Brno, Czech Republic Search for other works by this author on: Oxford Academic Google Scholar Šárka Mikmeková, Šárka Mikmeková Department of Electron Microscopy, Institute of Scientific Instruments ASCR, v.v.i., Brno, Czech Republic Search for other works by this author on: Oxford Academic Google Scholar Ivo Konvalina, Ivo Konvalina Department of Electron Microscopy, Institute of Scientific Instruments ASCR, v.v.i., Brno, Czech Republic Search for other works by this author on: Oxford Academic Google Scholar Luděk Frank Luděk Frank Department of Electron Microscopy, Institute of Scientific Instruments ASCR, v.v.i., Brno, Czech Republic Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 22, Issue S3, 1 July 2016, Pages 1650–1651, https://doi.org/10.1017/S1431927616009090 Published: 25 July 2016
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