Abstract
Shanghai high repetition-rate XFEL and extreme light facility (SHINE), the first hard XFEL based on a superconducting accelerated structure in China, is now under development at the Shanghai Institute of Applied Physics, Chinese Academy of Sciences. In this paper, power losses caused by trapped longitudinal high order modes (HOM) and steady-state loss generated by untrapped HOMs in 3.9 GHz SHINE cryomodule will be investigated and calculated. Results are presented for power losses of every element in 3.9 GHz cryomodule, caused by HOM excitation in the acceleration RF system of the continues-wave (CW) linac of SHINE.
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