Abstract
We have studied the microwave properties of 0.4 μm thick YBa2Cu3O7−x (YBCO) films on polycrystalline substrates with ion-beam-assisted-deposited yttria-stabilized zirconia buffer layers using a parallel-plate resonator technique at 10 GHz. The YBCO films with similar in-plane texture grown on both forsterite and Ni-based alloy substrates show similar microwave properties. We measure low-power surface resistance Rs values of about 0.5 mΩ at 76 K and 0.15 mΩ at 4 K for films with an in-plane mosaic spread of about 7°. Single-tone power-dependence measurements show that the surface resistance and the surface reactance increase linearly and by the same amount with increasing microwave field level. At intermediate power levels, the intermodulation measurements show odd-order intermodulation products that increase quadratically with two-tone input power. These results indicate a hysteretic vortex penetration mechanism in the weak links as the most plausible source of the observed nonlinearities in these films.
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