Abstract
Accurate measurements of the integrated intensities of several reflections from a standard powder sample of Ni have been made using monochromatic synchrotron X-ray radiation of wavelength 1.5413 A from a perfect double-crystal Si(111) monochromator. A perfect Ge(111) analyzer crystal was mounted on the detector arm of the diffractometer to serve as a narrow 'angular' receiving slit. The intensities were placed on an absolute scale by application of the appropriate powder diffraction expressions, which require the incident photon counts, the axial and equatorial openings of the receiving 'slit', and the polarization factor to be known. The procedure for evaluating these instrumental parameters is described in some detail. The quantitative agreement between these and previous absolute measurements on a standard Ni sample with Cu Kα radiation demonstrates that the synchrotron technique can be used for absolute measurements of high accuracy.
Published Version
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