Abstract
Potentials of electron probe microanalysis in determining hafnium, uranium, thorium, lead, niobium, titanium, manganese, iron, chromium, calcium, aluminum, tin, tungsten, yttrium, and lanthanide impurities in zircons have been studied. It was found that the background signal depends on the composition of the zircon crystal, including the concentration of hafnium. Methods have been proposed to improve the measurements of the background intensity and to optimize analytical conditions for attaining the lowest detection limits.
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