Potential‐Induced Degradation and Recovery of Perovskite Solar Cells

Abstract

In recent years, metal halide perovskite solar cells have become a major competitor in the run to lower the levelized cost of electricity (LCOE) of photovoltaic (PV) systems. Commercialization of this new technology mainly depends on the long‐term stability of such devices, for which potential‐induced degradation (PID) may represent a factor of detrimental impact. As PID can trigger rapid and significant losses in PV systems, it is generally considered among the most critical failure modes with a high financial repercussion. Herein, the results of PID tests on perovskite solar cells are reported for the very first time. The solar cells are found to be extremely susceptible to PID: 18 h of high‐voltage stress, according to the PID test standard IEC 62804‐1 TS (foil method at 60 °C), shows a performance degradation of up to 95%, which mainly results from a decrease in the short‐circuit current. These results also uncover near full PID recoverability and pave the way toward further research into its mechanisms, kinetics, and mitigation.