Abstract
The development of various parts of DoD Automatic Test Systems (ATSs), follows a costly process starting with the description of the products to be tested through fielding and operation of the ATS items. Insufficient implementation of standards in the ATS process is, to a large part, the reason for the high cost and risk. The IEEE Standards Coordinating Committee 20 (SCC20) is endeavoring to provide standards that address concerns of developing ATS and reducing associated costs. Two IEEE test standards are currently used by the Integrated Family of Test Equipment (IFTE). This paper investigates the potential benefits of greater use of IEEE standards during the development and maintenance cycles of IFTE and the associated Test Program Sets. >
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