Abstract
Three dimensional focusing of characteristic x-rays can be achieved by diffraction from doubly curved crystals (DCC). A focused beam total reflection x-ray fluorescence technique was developed based on these optics. This technique provides good detection sensitivity and spatial resolution for localized detection of surface deposits. Compact low power small spot x-ray sources were used to demonstrate the benefit of the x-ray optics for focusing Cr Kα, Cu Kα and Mo Kα radiation. The DCC optic was also applied to monochromatic micro x-ray fluorescence (MMXRF), providing good detection sensitivity and spatial resolution for deeper impurities. The detection capability of the focused beam TXRF and MMXRF systems was investigated with dried droplets of calibrated low concentration solutions. Additionally, the implementation of high contrast monochromatic imaging with a very low power source was demonstrated using the DCC optics at mammographic energies. Images of contrast phantoms were obtained with high clarity.
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