Abstract
We have measured the electron emission statistics for Xe+ and Xe10+ ions incident on clean polycrystalline copper at grazing angles of 10 and 23. The probability of no electron emission has been measured. The experimental data for 2–10 keV Xe+ ions is well described by binomial distributions. For Xe+ and Xe10+ the total electron yield has been determined. The potential and kinetic emission components have been deduced.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
