Abstract
We have measured the electron emission statistics for Xe+ and Xe10+ ions incident on clean polycrystalline copper at grazing angles of 10 and 23. The probability of no electron emission has been measured. The experimental data for 2–10 keV Xe+ ions is well described by binomial distributions. For Xe+ and Xe10+ the total electron yield has been determined. The potential and kinetic emission components have been deduced.
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