Abstract
The success of diffraction experiments from weakly scattering samples strongly depends on achieving an optimal signal-to-noise ratio. This is particularly important in single-particle imaging experiments where diffraction signals are typically very weak and the experiments are often accompanied by significant background scattering. A simple way to tremendously reduce background scattering by placing an aperture downstream of the sample has been developed and its application in a single-particle X-ray imaging experiment at FLASH is demonstrated. Using the concept of a post-sample aperture it was possible to reduce the background scattering levels by two orders of magnitude.
Highlights
The success of diffraction experiments from weakly scattering samples strongly depends on achieving an optimal signal-to-noise ratio
This is important in single-particle imaging experiments where diffraction signals are typically very weak and the experiments are often accompanied by significant background scattering
A simple way to tremendously reduce background scattering by placing an aperture downstream of the sample has been developed and its application in a single-particle X-ray imaging experiment at FLASH is demonstrated
Summary
The success of diffraction experiments from weakly scattering samples strongly depends on achieving an optimal signal-to-noise ratio. This is important in single-particle imaging experiments where diffraction signals are typically very weak and the experiments are often accompanied by significant background scattering.
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