Abstract

Different forms of representing data on subcritical crack growth are discussed, which makes it possible to compare materials and (or) interpret the physical meaning of the parameters of slow crack growth (SCG). The SCG parameters are determined for hot-pressed OTM-914 materials and an Si3N4 — SiC (NK) composite. The scattering of the results can be explained by errors of the method, variation of the properties over the bulk of the material, surface oxidation, and other causes.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.