Abstract
Piezoelectric material has been emerging as a popular building block in MEMS devices owing to its unique mechanical and electrical material properties. However, the reliability of MEMS devices under buckling deformation environments remains elusive and needs to be further explored. Based on the Talreja's tensor valued internal state damage variables as well as the Helmhotlz free energy of piezoelectric material, a constitutive model of piezoelectric materials with damage is presented. The Kachanvo damage evolution law under in-plane compressive loads is employed. The model is applied to the specific case of the postbuckling analysis of the piezoelectric plate with damage. Then, adopting von Karman's plate theory, the nonlinear governing equations of the piezoelectric plates with initial geometric deflection including damage effects under in-plane compressive loads are established. By using the finite difference method and the Newmark scheme, the damage evolution for damage accumulation is developed and the finite difference procedure for postbuckling equilibrium path is simultaneously employed. Numerical results show the postbuckling behaviors of initial flat and deflected piezoelectric plates with damage or no damage under different sets of electrical loading conditions. The effects of applied voltage, aspect ratio of plate, thick-span ratio of plate, damage as well as initial geometric deflections on the postbuckling behaviors of the piezoelectric plate are discussed.
Highlights
The use of piezoelectric materials in intelligent structures has received considerable attention in recent years due to the intrinsic direct and converse piezoelectric effects
To ensure the accuracy and effectiveness of the present method, a test example was calculated for postbuckling analysis of isotropic rectangular plate with initial geometric deflection
It can be found that the buckling loads increase with the increase of the thick-span ratio of plate, and that the control voltage has a small effect on the postbuckling behaviors of the plate with lower thick-span ratio
Summary
The use of piezoelectric materials in intelligent structures has received considerable attention in recent years due to the intrinsic direct and converse piezoelectric effects. Piezoelectric materials have been used as sensors or actuators for the control of the active shape or vibration of structures. Defects such as microcracks, voids, dislocations and delamination are introduced in piezoelectric materials during the manufacturing and poling process. Voids, dislocations and delamination are introduced in piezoelectric materials during the manufacturing and poling process The existence of these defects greatly affects the electric, dielectric, elastic, mechanical and piezoelectric properties of the piezoelectric materials, especially the service life of piezoelectric structures. It is important to understand the growth of these defects, the damage accumulation and the overall effect of these defects on the average mechanical and electrical properties of piezoelectric structures
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