Abstract
We have investigated the post heat treatment effect of electrochemically prepared cupric oxide (CuO) thin films. The films were annealed at different temperatures ranging from 200 to 400°C in air medium. The annealed films structural, optical, compositional and morphological properties were studied. X-ray diffraction patterns show that as-deposited film exhibited cubic structure with preferential orientation along the (111) plane. Annealing was induced further grain growth and tightened the grain size distribution. The morphological properties and surface roughness were studied using scanning electron microscopy and atomic force microscopy. Optical properties of the films were analyzed by recording transmission, absorption and reflection spectra. Optical band gap of as-deposited and annealed CuO thin films were estimated by conventional method.
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