Abstract
The ability to distinguish between heavy and light components of a specimen, and especially to distinguish single heavy atoms, would be a great benefit in many instances. Even with the demonstrated ability of the STEM, and of the CTEM especially in dark field, to image single atoms, it is of interest to know the possibility of using bright field in a conventional microscope with subsequent image processing to obtain images of single heavy atoms separated from the image of a lighter supporting film.Single-sideband image reconstruction, involving the combination of two images obtained using opposite halves of the diffraction pattern, offers in principle the ability to separate images of heavy and light specimen components, or specimen components giving rise to amplitude and phase contrast, respectively. This has been demonstrated in electron microscopy^, but under conditions or low resolution, where inelastic scattering, as well as scattering outside the effective objective aperture, contribute heavily to the component with amplitude contrast.
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