Abstract
The ortho-positronium (o-Ps) lifetime and intensity in cyclohexane was measured as a function of temperature at various wavelengths of illuminating light. Accommodation of excess electrons in traps was observed in whole range of rigid crystalline phase; the trap depth was about 0.75eV.At the wavelength λ<880nm a slight decrease of o-Ps lifetime in rigid phase was observed, which could be explained by photoionization of Ps atoms. The binding energy of hydrogenlike Ps atom confined in a void is smaller than that of free atom. The lifetime of o-Ps in plastic phase corresponds to that expected for positronium located in vacancies. The radii of voids obtained from the popular Tao–Eldrup model seem to be too small for the lifetimes of order of 1ns.Oxygen from surrounding atmosphere begins to penetrate the cyclohexane in plastic phase already 15K below the melting point.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
