Abstract
Two different polymer membranes, polyethylene and Nafion, have been sequentially implanted under vacuum at room temperature with 90 keV copper ions up to 1017 ions/cm2; after each implantation step, the targets were subjected to analysis with Positron annihilation lifetime spectroscopy and coincidence Doppler broadening spectroscopy. Both membranes revealed a similar behavior regarding the high fluence superficial implantation, but with different degree of magnitude. In order to endorse the Positrons annihilation spectroscopy results, scanning electron microscopy coupled with energy‐dispersive energy has been performed on the same targets, despite its lower sensitivity.
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