Abstract
An enhanced signal-to-noise ratio, slow positron coincidence Doppler broadening technique has been applied to study the characteristics of a Y1Ba2Cu3O7−δ superconducting thin film at sample temperatures of 15 K and 290 K. In this investigation, a numerical analysis of the Doppler spectra was employed to the determine the shape parameter S, defined as the ratio between the number of counts in a central portion of the spectrum and the total number of counts in the entire spectrum. The S-parameter values near 0.56 were relatively constant while the positron energies increased, which indicated the presence of voids in the thin film. The S-parameter values for the Y1Ba2Cu3O7−δ thin film showed no temperature dependence at temperatures above or below Tc because the positron trapping rate in vacancy-type defects was mostly influenced. The effect of the S-parameters caused by open volume defects is believed to be greater than the effect of the S-parameters caused by the electronic state transition in the Y1Ba2Cu3O7−δ superconductor.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
