Positive and negative variations in capacitive images for given defects under varying experimental conditions

Abstract

Capacitive imaging (CI) technique is a novel electromagnetic NDE technique. The Quasi-static electromagnetic field from the carefully designed electrode pair will vary when the electrical properties of the sample change, leading to the possibility of imaging. It is observed that for a given specimen, the targeted features appear as different variations in capacitive images under different experimental conditions. In some cases, even opposite variations occur, which brings confusion to indication interpretation. It is thus thought interesting to embark on investigations into the cause and effects of the negative variation phenomenon. In this work, the positive and negative variations were first explained from the measurement sensitivity distribution perspective. This was then followed by a detailed analysis using finite element models in COMSOL. A parametric experimental study on a glass fiber composite plate with artificial defects was then carried out to investigate how the experimental conditions affect the variation.