Abstract

Ptychography is a form of coherent diffractive imaging; it employs far-field intensity patterns of the object to reconstruct the object. In ptychography, an important limiting factor for the reconstructed image quality is the uncertainty in the probe positions. Here, we propose a new approach which uses the hybrid input–output algorithm and cross-correlation in a way that can correct our estimates of the probe positions. The performance and limitations of the method in the presence of noise, varying overlap, and maximum recoverable error are studied using simulations. A brief comparison with other existing methods is also discussed here.

Highlights

  • Imaging an object—replacing lenses with algorithms—is becoming extremely popular

  • This will create a miss-match in the overlapped region between parts of the object O j-1(r) and O j (r) which correspond to neighbouring probe positions

  • We have proposed an alternative method to correct the probe positions in ptychography which is significantly different from the CC method

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Summary

Introduction

Imaging an object—replacing lenses with algorithms—is becoming extremely popular. We have proposed a new method based on gradient of intensity patterns [14] that can correct the probe positions with sub-pixel accuracy while being less computationally expensive than the CC method. This method combines the well known techniques HIO and cross-correlation in a way that it can correct probe positions in ptychography This is possible mainly due to two important properties:. If the probe positions were correct, the overlapped part of the object corresponding to neighbouring probe positions will coincide with each other (see figure 2) The performance of this method with varying parameters and its limitations are presented here.

The method
Calculate the exit wave corresponding to each probe position j as:
Simulations
Varying number of ePIE and HIO iterations
Simulations in the presence of noise
Effect of the initial error and the overlap
Findings
Discussion
Conclusion

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