Abstract
The paper presents research results of metrological properties of algorithm DFT (4) and classical (5) for determining the RMS sinusoidal voltage measurements using an integrating sampling voltmeter. Tests were performed comparing measurement uncertainty calculated using a Monte Carlo method for both algorithms. Analyses were performed for selected, the most important sources of RMS voltage measurement uncertainty. Based on the results, it was found that the properties of both algorithms differ only in less accurate measurements. Below tens of ppm level voltage measurement uncertainty algorithms return the same results. (Comparison of DFT and classical algorithm properties in voltage measurement using a sampling voltmeter) Slowa kluczowe: pomiar napiecia skutecznego, algorytm DFT, algorytm klasyczny, niepewnośc pomiaru, metoda Monte Carlo, woltomierz probkujący.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
