Abstract
AbstractThe development of components for photonics applications is growing exponentially. The sol–gel method is now recognised as a convenient and flexible way to deposit oxide or glass films on a variety of hosts, including porous silicon. In the present work we incorporated erbium and europium doped xerogel into porous silicon and developed new porous silicon – rare earth doped glass composites. Various characteris‐ation techniques including FTIR, Raman Spectroscopy, Thermal Gravimetric Analysis and Scanning Electron Microscopy were employed in this work. (© 2005 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
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