Polysilicon sacrificial layer etching using ClF 3 for thin film encapsulation of silicon acceleration sensors with high aspect ratio

Abstract

We present a new thin film encapsulation technique for surface micromachined sensors using a polysilicon multilayer process. The main feature of the encapsulation process is that both the sacrificial layer above the silicon sensor structure and the cap layer consist of epitaxial polysilicon. The sacrificial layer is removed by chlorine trifluoride (ClF 3) plasmaless gas-phase etching through vents within the cap layer. The perforated cap membrane is sealed by a nonconformal oxide deposition. The method has been applied to a silicon surface micromachined acceleration sensor with high aspect ratio structures, but is broadly applicable. Capacitance–voltage measurements have been performed to show the electrical functionality of the accelerometer.