Abstract
This work discusses the performance of several NARX model identification techniques on a benchmark problem for black–box identification methods proposed in (Schoukens et al., 2008), concerning a SISO electronic nonlinear system with a Wiener–Hammerstein structure, originally documented in (Vandersteen, 1997). The objective being the obtainment of an accurate simulation model, capable of replicating the dynamic behavior of the system without using past measured output data, both prediction error and simulation error minimization methods have been tested and compared.
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