Abstract
AbstractThis work reviews new probe and electron microscopy approaches for the detection of charged domains in insulating polymers, as well as for the identification of the charge‐bearing species: scanning electric potential microscopy (SEPM), electric force microscopy (EFM) and energy‐loss spectroscopy imaging in the transmission electron microscope (ESI‐TEM). The SEPM and EFM micrographs show patterned domains bearing excess electric charges and extending for tens of nanometers, in polymer latex particles and films. The charged species are identified by ESI‐TEM as emulsion polymerization initiator and surfactant residues, as well as the associated counter‐ions. Charged domains are also observed in common thermoplastic polymers, producing unexpectedly large electric potential gradients.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
