Polycrystalline Cd 1−xZn xTe thin films on glass by pulsed laser deposition

Abstract

Polycrystalline thin films of Cd 1-xZn xTe on glass were grown by pulsed laser deposition using an XeCl excimer laser. X-ray diffraction, optical absorption, Raman scattering and energy dispersive x-ray analysis were used to characterize these films. The grains show a predominant <111> orientation with considerable amounts of <113> for the alloys. The band gap energy exhibits a small amount of bowing and the phonons display the expected two-mode behavior. Substrate temperatures above 275°C resulted in optical quality films with good stochiometry for deposition rates below ∼ 1 Å/ pulse.