Abstract
We report on a polarizing interferometer-ellipsometer arrangement that overcomes the need for additional measurements with a retarder for the unambiguous determination of the ellipsometric parameters in the far infrared spectral range. It consists of a Martin-Puplett interferometer and a wire-grid polarizer as an analyzer. The application of such interferometer-ellipsometer is experimentally demonstrated on a polyethylene sample deriving the refractive index and the thickness in the spectral range between 15 and 35cm-1. Based on these results, a similar solution without a retarder for the mid-infrared spectral region is additionally proposed.
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