Polarized X-ray absorption spectroscopy and XPS of TiS3: S K- and Ti L-edge XANES and S and Ti 2p XPS

Abstract

Sulfur and Ti 2p XPS and polarized S K- and L2,3- and Ti L2,3-edge XANES spectra have been obtained from oriented ribbon-like crystals of TiS3 grown by vapor transport. The S 2p XPS spectrum for (001) crystal faces has line widths of 0.53eV and is completely accounted for by partially overlapped 2p3/2/2p1/2 doublets for sulfide (S2−) and disulfide (S22-) species, which are separate and independent entities in TiS3. Evidence of unsaturated surface states is lacking, consistent with a surface monolayer for the (001) growth face of disulfide atoms oriented with their charge-neutral sides outward. The S K-edge XANES spectra show pronounced anisotropy in the (001) plane of TiS3 crystals, associated with the photoelectron transition channel S 1s→3pxσu∗ with the electric vector (E) parallel the a-axis (and the S–S bond of the disulfide group), and transitions to unoccupied antibonding orbitals of S–Ti bonds with E parallel to the b-axis (the direction of the well-known quasi-one-dimensional character of TiS3). The XPS and ultrasoft and soft X-ray region XANES spectra confirm the surface and near-surface structural integrity of TiS3.