Polarized Raman spectroscopy ofv−SiO2under rare-gas compression

Abstract

High-pressure polarized Raman spectra of vitreous silica are measured up to 8 GPa in a diamond-anvil cell at room temperature. The combined use of either a nonpenetrating pressurizing medium---argon---or a penetrating one---helium, allows one to separate density from stress effects on the Raman frequencies. In the framework of a simple central force model, the results emphasize the distinct role played by the shrinkage of the intertetrahedral angle Si-O-Si and the force-constant stiffening during the compression. The polarization analysis further reveals the existence of an additional isotropic component in the high-frequency wing of the boson peak. The pressure dependence of the genuine boson peak frequency is found to be much weaker than previously reported and even goes through a minimum around 2 GPa in remarkable coincidence with the anomalous compressibility maximum of silica.