Abstract
The polarization dependence of band-edge excitonic transitions in Ag(In0.5Al0.5)S2 has been characterized using polarized thermoreflectance (PTR). The polarization-sensitive behavior of the and band-edge excitons was detected and characterized by angle-dependent PTR measurements from θ = 0 [] to 90° [] with respect to the chalcopyrite crystal’s needle axis. The polarized photoconductivity of Ag(In0.5Al0.5)S2 has also been characterized using an array of white light-emitting diodes with the polarization angles ranging from 0 to 360°. The experimental results demonstrate that Ag(In0.5Al0.5)S2 is a suitable material for the fabrication of polarization-sensitive photodetectors applied in the visible region.
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