Polarized Neutron Reflectometry for the Analysis of Nanomagnetic Systems

Abstract

In recent years, polarized neutron reflectometry (PNR) has played an essential role for the exploration of magneto- and spintronic structures. Well known systems extensively studied include exchange coupled magnetic superlattices, exchange bias systems between ferromagnetic and antiferromagnetic films, exchange spring valves between soft and hard magnetic films, and more recently magnetic semiconductors and ferromagnetic Heusler alloy films and superlattices. In addition to studies of laterally extended layered systems, neutron scattering has now been applied to the exploration of periodic magnetic arrays, such as stripes and islands on the submicrometer scale. Although the competition with magneto-optics and X-ray resonant magnetic scattering (XRMS) has increased in recent years, there are some advantages PNR offers that are hard to challenge. One of those is the quantitative analysis of the data via fits to theoretical models based on the distorted wave Born approximation (DWBA), which accounts for both specular and off-specular scattering. The second one is spin flip (SF) scattering, which has no counterpart in XRMS. SF scattering probes magnetization fluctuations transverse to the mean magnetization direction and gives access to magnetic roughness and magnetic domain states. Specular and off-specular PNR work is exemplified by most recent work on spintronic materials and on patterned and functionalized magnetic layers.