Abstract
We present and apply a new method to measure directly weak magnetization in thin films. The polarization of a neutron beam channeling through a thin film structure is measured after exiting the structure edge as a microbeam. We have applied the method to a tri-layer thin film structure acting as a planar waveguide for polarized neutrons. The middle guiding layer is a rare earth based ferrimagnetic material TbCo5 with a low magnetization of about 20 mT. We demonstrate that the channeling method is more sensitive than the specular neutron reflection method.
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