Abstract
At the National Institute of Standards and Technology (NIST) and Indiana University, we are developing polarized 3 He analyzers for neutron reflectometry. We have employed 3 He analyzers at two polarized neutron reflectometers, NG1 at the NIST Center for Neutron Research (NCNR) and POSY I at the Intense Pulsed Neutron Source (IPNS), Argonne National Laboratory. The long-term goal for both efforts is to perform efficient studies of magnetic diffuse scattering. At the NCNR, we tested a 3 He analyzer by comparing measurements of specular scattering obtained with a supermirror analyzer to those obtained with a 3 He analyzer. For this test, we measured the spin-flip and nonspin-flip scattering from a Mn 0.52Pd 0.48/Fe thin film. The results with the 3 He analyzer show very good agreement with those obtained with the supermirror analyzer. We have also carried out tests of the 3 He analyzer for application to magnetic diffuse scattering experiments. We discuss the development of a 3 He analyzer for IPNS that will be employed for studies of patterned magnetic arrays.
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