Abstract
Polarization-insensitive electromagnetically induced transparency (EIT) based on ultra-thin coupling planar metamaterials has been numerically demonstrated. The height (h) of ultra-thin coupling planar metamaterials can reach to 1/94 λ, which is the thinnest height so far. Such ultra-thin EIT metamaterials can reduce the cost of production. When the angles of the incident electromagnetic wave are changed, the EIT metamaterials show polarization-insensitive characteristics. When the height of the EIT metamaterials gradually increases, the group index gradually decreases and the transmission peak value and h/λ gradually increase. All of above characteristics make the ultra-thin coupling EIT have potential application in slow light devices. In addition, using the coupling of the top and below layer has proposed a way to obtain ultra-thin metamaterials in the microwave region.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
