Abstract
We present a practicable way to take advantage of the spectral information contained in a broadband terahertz pulse for the determination of birefringence and orientation of the optical axis in a glass fiber reinforced polymer with a single measurement. Our setup employs circularly polarized terahertz waves and a polarization-sensitive detector to measure both components of the electromagnetic field simultaneously. The anisotropic optical parameters are obtained from an analysis of the phase and frequency resolved components of the terahertz field. This method shows a high tolerance against the skew of the detection axes and is also independent of a reference measurement.
Highlights
We have effectively converted our scanning Terahertz (THz) imaging setup [1] into a circular polariscope, which detects the phase difference introduced by a slow and fast optical axis but is independent of their orientation [2]
We present a practicable way to take advantage of the spectral information contained in a broadband terahertz pulse for the determination of birefringence and orientation of the optical axis in a glass fiber reinforced polymer with a single measurement
We have presented an advanced setup for polarization sensitive (PS) THz imaging and developed an algorithm for the extraction of birefringence and the orientation of the optical axis, which exhibit several advantages: Measurements in reflection geometry automatically double the optical path length in the
Summary
We have effectively converted our scanning Terahertz (THz) imaging setup [1] into a circular polariscope, which detects the phase difference introduced by a slow and fast optical axis but is independent of their orientation [2]. THz radiation features a large penetration depth in many dielectric materials [3, 4] and allows for non-destructive measurements even on thick samples [5], which are otherwise opaque in the visible and near-infrared. In order to test the mechanical strength of the sample non-destructively, the birefringence and orientation of the optical axis in the sample can be detected by PS THz measurements [6].
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